結論與參考文獻

 

目前吾人致力於利用影像處理自動化檢測判讀塑膠成品,但塑膠射出物體之影像處理檢測常出現如下之困擾:

1.背景的干擾:背景光常擾亂主題而使主題待測物不明顯,以致出現

條紋誤判。

2.反光區域之雜訊:由於待測物表面太光滑而導致其一部位強烈反光

而使得其他條紋漫滅不清或斷線。

3.物體本身之條紋干擾:物體本身由於有突然的陡生陡降的曲線以致

造成陰影而遭誤判為光彈條紋,而產生條紋相交之情形。

因此在本文中,利用影像處理自動化檢測判讀塑膠成品,但只侷限在少數幾種已知形狀的工件。

參考資料

1.R.S.Chang and D.C.Chern, High Degree of Acanacy in Flatness

and Parallelism of Thin Sapphire Flat Lens Manufacture, J.Opt.Eng.

(1994)

2.Rong-Seng Chang , Chern Sheng Lin, An Artificial Intelligence Syst for Producing and bossing HOE , Journal of Optical Mory and Neural Networks,

2 (4) 251-258 , ( 1993 )

3.Frados,J. (1976) Plastics Engineering Handbook of the Society of the

Plastic Industry, SPI. Inc. 4th Ed. USA

4. Kubo, K. and Sakai, K. (1991), Process for preparing blazed holograms

, U.S. patent No.5,013,494

5. D'Amato, S.F. and Mallik, D.W., (1991) Plastic molding of articles including a hologram or other microstructure , U.S. patent No.5,071,597

6. Chovan, J. , Penn, W.A. , Tiann, J.J., Engeler, W.E. (1990), Electronic holographic apparatus, U.S. patent No.4,974,920

7. Hutley, M.C. (1976) Coherent Photofabrication, Optical Engineering, 15, 190-1968. Chang, R.Y. (1991) The CAE-MOLD series program, CAE-FLOW, CAE-PACK, CAE- COOL and CAE-WARP etc. CAE-Lab. in National Tsing Hua University Republic of China

replay.gif (15720 bytes)回首頁