1. TIMOTHY R. PRYOR "Applications of Lasers to Production Metrology, Control,and Machine "Vision"PROCEEDINGS OF THE IEEE ,VOL. 70,NO. 6, June1982 2. Wolf,S.M. , Applied Optics , 15, p2645 (1976) 3. Keilman ,F,Applied Optics, vol.9 ,p1319 (1970) 4. DAVID NITZAN"The Measurement and Use of Registered Reflectance and Range Data in Scene Analysis"PROCEEDING OF THE IEFE, VOL. 65. NO.2,FEBRUARY 5. C. A. Depew and R. D. Weir "Surface Roughness Determination by the Measurement of Reflectance "April 1971 / Vol. 10, No.4/ APPLIED OPTICS 6. Emoke Lorincz, Peter Richter,and FerencEngard"Interferometric statistical measurement of surface roughness" APPLIED OPTICS/ Vol.25.No.16/ 15 August 1986 7. E. G. Thwaite "The Extension of Optical angular Scattering Techniques to the Measurement of Intermediate Scale Roughness" 8. Wai-Hon Lee "Signal processing techniques for CCD image sensors " APPLIED OPTICS / VOL. 23.NO.23 /1 December 1984 9. Chang, R. S. "Error Analysis of High Camera by Interferometer, Laser Reflected Spot. and Testing Chart Method." Proceedings of SPIE, vol. 348, pp922-923 15th International congress on high speed photography and photonics Aug. 21, 19 10. Chang, R.S., "The measurement of seeker's aiming point by high speed TV camera" Proceeding of SPIE, Vol. 674, 17th International congress on high speed photography and photonics, 1-5 September 1986, Pretoria, Republic of South Africa. 11. Chang, R. S., Cheng, T. "High Speed Photography on Zone Plate Madked Object." Proceeding of SPIE Vol. 497, SPIE's 28th Annual International Technical Symposium on Optics and Electro-Optics, 19-24 Aug. San Diego, California, U.S.A. 12. Klein,W.R."Theoretical efficiency of Bragg devices",Proc IEEE 54 (1966)803- 13. James W Dally and William Riley, "Experimental Stress Analysis", McGraw-Hill Inc (1978)
2. Wolf,S.M. , Applied Optics , 15, p2645 (1976)
3. Keilman ,F,Applied Optics, vol.9 ,p1319 (1970)
4. DAVID NITZAN"The Measurement and Use of Registered Reflectance and Range Data in Scene Analysis"PROCEEDING OF THE IEFE, VOL. 65. NO.2,FEBRUARY
5. C. A. Depew and R. D. Weir "Surface Roughness Determination by the Measurement of Reflectance "April 1971 / Vol. 10, No.4/ APPLIED OPTICS
6. Emoke Lorincz, Peter Richter,and FerencEngard"Interferometric statistical measurement of surface roughness" APPLIED OPTICS/ Vol.25.No.16/ 15 August 1986
7. E. G. Thwaite "The Extension of Optical angular Scattering Techniques to the Measurement of Intermediate Scale Roughness"
8. Wai-Hon Lee "Signal processing techniques for CCD image sensors " APPLIED OPTICS / VOL. 23.NO.23 /1 December 1984
9. Chang, R. S. "Error Analysis of High Camera by Interferometer, Laser Reflected Spot. and Testing Chart Method." Proceedings of SPIE, vol. 348, pp922-923 15th International congress on high speed photography and photonics Aug. 21, 19
10. Chang, R.S., "The measurement of seeker's aiming point by high speed TV camera" Proceeding of SPIE, Vol. 674, 17th International congress on high speed photography and photonics, 1-5 September 1986, Pretoria, Republic of South Africa.
11. Chang, R. S., Cheng, T. "High Speed Photography on Zone Plate Madked Object." Proceeding of SPIE Vol. 497, SPIE's 28th Annual International Technical Symposium on Optics and Electro-Optics, 19-24 Aug. San Diego, California, U.S.A.
12. Klein,W.R."Theoretical efficiency of Bragg devices",Proc IEEE 54 (1966)803-
13. James W Dally and William Riley, "Experimental Stress Analysis", McGraw-Hill Inc (1978)